PIA11041: Sharp Tips on the Atomic Force Microscope


Sharp Tips on the Atomic Force Microscope

Caption:

This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007.

Background Info:

The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London.

The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

Photojournal Note: As planned, the Phoenix lander, which landed May 25, 2008 23:53 UTC, ended communications in November 2008, about six months after landing, when its solar panels ceased operating in the dark Martian winter.

Cataloging Keywords:

Name Value Additional Values
Target Mars
System
Target Type Planet
Mission Phoenix
Instrument Host Phoenix Lander Phoenix Mars Lander
Host Type Lander
Instrument Microscopy, Electrochemistry, and Conductivity Analyzer (MECA)
Detector
Extra Keywords Grayscale
Acquisition Date
Release Date 2008-08-14
Date in Caption 2007-08-04
Image Credit NASA/JPL-Caltech/University of Arizona/University of Neuchatel
Source photojournal.jpl.nasa.gov/catalog/PIA11041
Identifier PIA11041